Quartz成像公司最近推出On-X系统,作为其创新XoneEDX/EDSX光微分析系统的一部分ON-X脱角检测器是业界第一个安装在硅流检测器端端上的电子检测器。它提供与X射线映射相同的视觉角BSE成像
The Quartz ON-X Take Off Angle Detector sets the Quartz XOne EDX/EDS Microanalysis System apart from any other EDX/EDS system. Users can take advantage of the fact that for the first time they can acquire BSE images that are taken at the same viewing angle as their X-ray maps. ON-X Images always include both compositional and elemental contrast, adding unique image quality and perspective. As well, ON-X images provide an electron image with near perfect correlation to your X-ray maps. Now you can confirm if dark areas in your X-ray maps are due to topography-induced shadowing, rather than low element concentrations.
Quartz XOneEDS/EDX系统安装在SilconDrift检测器电子陷阱上不需要使用额外端口,它共享EDS/EDX端口。
Quartz XoneX光微分析系统与大多数SEMs兼容XOI系统包括EDX/EDS软件满足所有x射线微分析需求,并包括我们行业领先PCI数字成像软件的许多功能。Quartz XOI系统是Quartz PCI产品圈成员并分享常用用户接口并兼容广受欢迎的Quartz PCI软件
关于Quartz成像公司-Quartz成像公司有超过2 000名客户分布于38个国家,使用行业领先数字图像采集处理解决方案(大多数图像生成工具包括SEMs、TEMs、STEMs、TortopSEMs、Cames、PC基础工具、Scanners)21CFR部分11实验室信息管理系统故障分析实验系统工具存取控制工具远程控制自动检测系统纳米技术X光微分析系统等www.quartzimaging.com